Modeling of negative bias temperature instability effects in silicon nanowire transistors
Shrivastava, Ashish
Modeling of negative bias temperature instability effects in silicon nanowire transistors - Roorkee Department of Electronics and Computer Engineering 2014 - xii, 46 p.
Manhas, Sanjeev
Department of Electronics and Computer Engineering, IIT Roorkee Thesis Detial : IIT Roorkee M.Tech June 2014
621.38072 / SHR
Modeling of negative bias temperature instability effects in silicon nanowire transistors - Roorkee Department of Electronics and Computer Engineering 2014 - xii, 46 p.
Manhas, Sanjeev
Department of Electronics and Computer Engineering, IIT Roorkee Thesis Detial : IIT Roorkee M.Tech June 2014
621.38072 / SHR
