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Radiation induced soft errors in CMOS circuits

Gupta, Akash

Radiation induced soft errors in CMOS circuits - India Indian Institute of Technology 2016 - x, 39p.

Subjects--Personal Names:
Dasgupta, Dudeb; Manhas, Sanjeev; Jain, Abhishek

Subjects--Facted Index Terms:
Department of Mechanical Engineering

Dewey Class. No.: 621.38072 / GUP

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