Electron Nano-Imaging Basics of imaging and diffraction for TEM and STEM

By: Tanaka, NobuoMaterial type: TextTextPublication details: Japan Springer 2017Description: 333pISBN: 9784431565000Subject(s): Electron microscopy | Transmission electron microscopyDDC classification: 502.825
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Holdings
Item type Current library Shelving location Call number Copy number Status Date due Barcode
Book Book Mahatma Gandhi Central Library
CMD 502.825 T12E (Browse shelf(Opens below)) 1 Available 387277
Book Book Mahatma Gandhi Central Library
502.825 T12E (Browse shelf(Opens below)) 2 Available 387278

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