Random testing of digital circuits theory and applications

By: David, ReneMaterial type: TextTextPublication details: New York Marcel Dekker 1998Description: xx, 475pSubject(s): Digital Integrated circuitsDDC classification: 621.3815
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Item type Current library Call number Copy number Status Date due Barcode
Book Book Mahatma Gandhi Central Library
621.3815 D19R (Browse shelf(Opens below)) 1 Available 292896

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