Transmission electron microscopy and diffractometry of materials

By: Fultz, BrentContributor(s): Howe, James jt.auMaterial type: TextTextPublication details: Berlin Springer-Verlag 2001Description: xix,748p. 24cmISBN: 3540678417Subject(s): Materials-Microphysical properties | X-ray diffractometerDDC classification: 620.11299
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Holdings
Item type Current library Call number Copy number Status Date due Barcode
Book Book Mahatma Gandhi Central Library
620.11299 F97T (Browse shelf(Opens below)) 1 Available 320395
Book Book Mahatma Gandhi Central Library
620.11299 F97T (Browse shelf(Opens below)) 2 Available 323820

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