Pattern recognition and machine learning; proceedings of the Japan-U.S.Seminar on the learning process in control systems,held in Nagoya,Japan August 18-,19700

Contributor(s): Fu, K.S. EdMaterial type: TextTextPublication details: New York Plenum Press 1971Description: 341Subject(s): Pattern RecognitionDDC classification: 621.3819598
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Item type Current library Call number Copy number Status Date due Barcode
Book Book Mahatma Gandhi Central Library
621.3819598 F95P (Browse shelf(Opens below)) 1 Available 145825
Book Book Mahatma Gandhi Central Library
621.3819598 F95P (Browse shelf(Opens below)) 2 Available 132854

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