Physical aspects of electron microscopy and microbeam analysis

Contributor(s): Beaman, D.R. Ed. Siegel, B.M. EdMaterial type: TextTextPublication details: 1975Subject(s): Electron MicroscopyDDC classification: 535.3325
Tags from this library: No tags from this library for this title. Log in to add tags.
Star ratings
    Average rating: 0.0 (0 votes)
Holdings
Item type Current library Call number Copy number Status Date due Barcode
Book Book Mahatma Gandhi Central Library
535.3325 S43P (Browse shelf(Opens below)) 1 Available 153825

There are no comments on this title.

to post a comment.

Powered by Koha