Test pattern generation for vlsi circuits

By: Sharma, Gopal Krishan | University of RoorkeeContributor(s): Ahmad, S. Guide Agrawal, R.P. GuideMaterial type: TextTextPublication details: Roorkee ECD 1997Description: iii,170 Index Term-Uncontrolled Vlsi CircuitsDDC classification: 621.38072
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Item type Current library Call number Copy number Status Date due Barcode
Thesis Thesis Mahatma Gandhi Central Library
621.38072 SHA (Browse shelf(Opens below)) 1 Available 247412

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