Testability analysis of digital circuits based on camelot and scoap

By: Khan, Parvez Mahmood | University of Roorkee, Roorkee, Electronics & Computer EngineeringContributor(s): Anurag GuMaterial type: TextTextPublication details: 1992Description: 101 + 24p. 28cm. Index Term-UncontrolledDDC classification: 621.38072
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Thesis Thesis Mahatma Gandhi Central Library
621.38072 KHA (Browse shelf(Opens below)) 1 Available 245602
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