Agarwal, S. <br/><br/>
Uncertainty patterns and sensitivity analysis of an indicator based chemical process design framework 

 - Roorkee  Department of Chemical Engineering  2008 
 - 86 p. 
<br/><br/><label>Subjects--Personal Names: </label><br/>Wasewar, K.  Thesis Detial  :  IIT Roorkee M.Tech June 2008
<br/><br/><label>Dewey Class. No.: </label>660.072  / AGA