Gupta, Akash <br/><br/>
Radiation induced soft errors in CMOS circuits 

 - India  Indian Institute of Technology  2016 
 - x, 39p. 
<br/><br/><label>Subjects--Personal Names: </label><br/>Dasgupta, Dudeb; Manhas, Sanjeev; Jain, Abhishek
<br/><br/><label>Subjects--Facted Index Terms: </label><br/>Department of Mechanical Engineering
<br/><br/><label>Dewey Class. No.: </label>621.38072  / GUP