TY  - BOOK
AU  - Gupta, Akash
TI  - Radiation induced soft errors in CMOS circuits
U1  - 621.38072 
PY  - 2016///
CY  - India
PB  - Indian Institute of Technology
KW  - Dasgupta, Dudeb; Manhas, Sanjeev; Jain, Abhishek
KW  - Department of Mechanical Engineering
ER  -