Shama, Deepak Kumar <br/><br/>
Characterization of low frequency noise in silicon nanowire mosfet and related implications 

 - India  Indian Institute of Technology  2020 
 - 101p. 
<br/><br/><label>Subjects--Personal Names: </label><br/>Datta, Arnab
<br/><br/><label>Subjects--Facted Index Terms: </label><br/>Department of Electronics and Communication Engineering
<br/><br/><label>Dewey Class. No.: </label>621.38072  / SHA