TY  - BOOK
AU  - Shama, Deepak Kumar
TI  - Characterization of low frequency noise in silicon nanowire mosfet and related implications
U1  - 621.38072 
PY  - 2020///
CY  - India
PB  - Indian Institute of Technology
KW  - Datta, Arnab
KW  - Department of Electronics and Communication Engineering
ER  -