David, Rene <br/><br/>
Random testing of digital circuits  theory and applications 

 - New York  Marcel Dekker  1998 
 - xx, 475p. 
<br/><br/><label>Subjects--Uniform Titles: </label><br/>Digital Integrated circuits
<br/><br/><label>Dewey Class. No.: </label>621.3815  / D19R