Fujiwara, Hideo <br/><br/>
Logic testing and desingn for testability 

 - Cambridge  MIT Press  1996 
 - x,284p. 
<br/><br/><label>Subjects--Uniform Titles: </label><br/>Electronic circuits
<br/><br/><label>Dewey Class. No.: </label>621.38153  / F95L