TY  - BOOK
AU  - Shindo, D.
AU  - Oikawa, T. jt.au.
TI  - Analytical electron microscopy for materials science
SN  - 4431703365
U1  - 669.950282 
PY  - 2002///
CY  - Tokyo
PB  - Springer
KW  - Electron metallography
KW  - Electron microscopy
ER  -