Anand, Radhey Shyam <br/><br/>
Ultrasonic imaging system for flaw characterization 

 - Roorkee  EED  1992 
 - iii,201  Index Term-Uncontrolled  Flaw Characteriation; Ultrasonic Imaging System 
<br/><br/><label>Dewey Class. No.: </label>621.3072  / ANA