TY  - BOOK
AU  - Sharma, Gopal Krishan
AU  - Ahmad, S. Guide Agrawal, R.P. Guide
ED  - University of Roorkee
TI  - Test pattern generation for vlsi circuits
U1  - 621.38072 
PY  - 1997///
CY  - Roorkee
PB  - ECD
ER  -