TY  - BOOK
AU  - Salgiya, Sudhanshu
AU  - Sarkar, S. Gu.
ED  - University of Roorkee, Roorkee, Electronics & Computer Engineering
TI  - Effect of device scaling on mosfet gate bias voltage for drain current zero temperature coefficient
U1  - 621.38072 
PY  - 1996///
ER  -