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Ultrasonic imaging system for flaw characterization

by Anand, Radhey Shyam | University of Roorkee | Chitore, D.S. Guide.

Material type: Text Text Publication details: Roorkee EED 1992Availability: Items available for loan: 1 Call number: 621.3072 ANA.

Flaw detection using ultrasonic tecniques

by Anand, Radhey Shyam | University of Roorkee, Roorkee, Electrical Engineering | Verma, H.K. Gu.

Material type: Text Text Publication details: 1987Availability: Not available: Withdrawn (1).

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