3-Dimensional simulation of single event upset of 6T-soi based 24nm-finfet sram cell

By: Jayaram, NContributor(s): Dasgupta, S. Bulusu, A. Thesis Detial : M.TechMaterial type: TextTextPublication details: Roorkee Department of electronics & communication engineering 2013Description: ix, 42 pDDC classification: 621.38072
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Item type Current library Call number Copy number Status Date due Barcode
Thesis Thesis Mahatma Gandhi Central Library
621.38072 JAY (Browse shelf(Opens below)) 1 Available G22261

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