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Memory testing scheme for finfet based sram cell

by Prasad, K.D | Dasgupta, S. Kaushik, B.K. Thesis Detial : M.Tech 2012.

Material type: Text Text Publication details: Roorkee Department of Electronics and Computer Engineering 2012Availability: Items available for loan: 1 .

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Leakage current reduction using input vector control approach

by Singh, S | Dasgupta, S. Kaushik, B.K. Thesis Detial : M.Tech.

Material type: Text Text Publication details: Roorkee Department of electronics &communication engineering 2013Availability: Items available for loan: 1 Call number: 621.38072 SIN.

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