000			00351nam a2200121Ia 4500
008			220709b1964 xxu||||| |||| 00| 0 eng d
082			_a539.7211 _bA45S
100			_aAmerican Socity for Testing and Materials
245			_aSymphosium on X- Ray and electron probe analysis
260			_aUSA _bAmerican Socity for Testing and Materials _c1964
300			_avi, 209p.
942			_cBooks
906			_a121344
981			_aUSA: American Socity for Testing and Materials, 1964.
982			_avi, 209p.
983			_aSymphosium on X- Ray and electron probe analysis
999			_c113677 _d113677