| 000 | 00379nam a2200157Ia 4500 | ||
|---|---|---|---|
| 008 | 220709b1990 xxu||||| |||| 00| 0 eng d | ||
| 082 |
_a621.38152 _bS23S |
||
| 100 | _aSchroder, Dieter K. | ||
| 245 | _aSemiconductor material and device characterization | ||
| 260 |
_aNew York _bJohn Wiley _c1990 |
||
| 300 | _axv,599p. | ||
| 630 | _aSemiconductors | ||
| 964 | _bEnglish | ||
| 964 | _ePaper Fo | ||
| 942 | _cBooks | ||
| 906 | _a3490 | ||
| 981 | _aNew York: John Wiley, 1990. | ||
| 982 | _axv,599p. | ||
| 983 | _aSemiconductor material and device characterization | ||
| 999 |
_c3370 _d3370 |
||