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Physical principle of electron microscopy an introduction to TEM, SEM and AEM

Egerton, Ray F.

Physical principle of electron microscopy an introduction to TEM, SEM and AEM - New York Springer Science 2005 - xi,202p. 23cm.

ISBN: 0387258000

Subjects--Uniform Titles:
Electron microscopy

Dewey Class. No.: 535.843 / E40P

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