Physical principle of electron microscopy an introduction to TEM, SEM and AEM

By: Egerton, Ray FMaterial type: TextTextPublication details: New York Springer Science 2005Description: xi,202p. 23cmISBN: 0387258000Subject(s): Electron microscopyDDC classification: 535.843
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Holdings
Item type Current library Call number Copy number Status Date due Barcode
Book Book Mahatma Gandhi Central Library
535.843 E40P (Browse shelf(Opens below)) 1 Available 324155
Book Book Mahatma Gandhi Central Library
535.843 E40P (Browse shelf(Opens below)) 2 Available 326063

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