Essentials of electronic testing for digital, memory and mixed-signal vlsi circuits

Bushnell, Michael L.

Essentials of electronic testing for digital, memory and mixed-signal vlsi circuits - New York Springer-Science 2000 - xvii,690p. 25cm.

0792379918


Integrated circuits-Very large scale integration-Testing
Mixed signal circuits-Testing
Semiconductor storage devices-Testing
Digital integrated circuits-Testing

621.395 / B98E

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