Essentials of electronic testing for digital, memory and mixed-signal vlsi circuits

By: Bushnell, Michael LContributor(s): Agrawal, Vishwani D. jt.auMaterial type: TextTextPublication details: New York Springer-Science 2000Description: xvii,690p. 25cmISBN: 0792379918Subject(s): Integrated circuits-Very large scale integration-Testing | Mixed signal circuits-Testing | Semiconductor storage devices-Testing | Digital integrated circuits-TestingDDC classification: 621.395
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Item type Current library Shelving location Call number Copy number Status Date due Barcode
Book Book Mahatma Gandhi Central Library
ECD 621.395 B98E (Browse shelf(Opens below)) 1 Available 324776

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