Radiation induced soft errors in CMOS circuits

By: Gupta, AkashMaterial type: TextTextPublication details: India Indian Institute of Technology 2016Description: x, 39pSubject(s): Dasgupta, Dudeb; Manhas, Sanjeev; Jain, Abhishek | Department of Mechanical EngineeringDDC classification: 621.38072
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Item type Current library Call number Copy number Status Date due Barcode
Thesis Thesis Mahatma Gandhi Central Library
621.38072 GUP (Browse shelf(Opens below)) 1 Available G25533

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