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Random testing of digital circuits theory and applications

By: David, ReneMaterial type: Text

TextPublication details: New York Marcel Dekker 1998Description: xx, 475pSubject(s): Digital Integrated circuitsDDC classification: 621.3815

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Holdings
Item type	Current library	Call number	Copy number	Status	Date due	Barcode
Book	Mahatma Gandhi Central Library	621.3815 D19R (Browse shelf(Opens below))	1	Available		292896