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Characterization of low frequency noise in silicon nanowire mosfet and related implications

Shama, Deepak Kumar

Characterization of low frequency noise in silicon nanowire mosfet and related implications - India Indian Institute of Technology 2020 - 101p.

Subjects--Personal Names:
Datta, Arnab

Subjects--Facted Index Terms:
Department of Electronics and Communication Engineering

Dewey Class. No.: 621.38072 / SHA

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