Characterization of low frequency noise in silicon nanowire mosfet and related implications (Record no. 162097)

MARC details
000 -LEADER
fixed length control field 00470nam a2200145Ia 4500
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 220709b2020 xxu||||| |||| 00| 0 eng d
082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER
Classification number 621.38072
Item number SHA
100 ## - MAIN ENTRY--PERSONAL NAME
Personal name Shama, Deepak Kumar
245 ## - TITLE STATEMENT
Title Characterization of low frequency noise in silicon nanowire mosfet and related implications
260 ## - PUBLICATION, DISTRIBUTION, ETC.
Place of publication, distribution, etc. India
Name of publisher, distributor, etc. Indian Institute of Technology
Date of publication, distribution, etc. 2020
300 ## - PHYSICAL DESCRIPTION
Extent 101p.
600 ## - SUBJECT ADDED ENTRY--PERSONAL NAME
Personal name Datta, Arnab
654 ## - SUBJECT ADDED ENTRY--FACETED TOPICAL TERMS
Focus term Department of Electronics and Communication Engineering
982 ## - EQUIVALENCE OR CROSS-REFERENCE-SERIES STATEMENT--CONFERENCE OR MEETING NAME/TITLE [LOCAL, CANADA]
Meeting name or jurisdiction name as entry element 101p.
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Koha item type
906 ## - LOCAL DATA ELEMENT F, LDF (RLIN)
a 185934
981 ## - EQUIVALENCE OR CROSS-REFERENCE-SERIES STATEMENT--CORPORATE NAME/TITLE [LOCAL, CANADA]
Corporate name or jurisdiction name as entry element India: Indian Institute of Technology, Roorkee, 2020.
983 ## - EQUIVALENCE OR CROSS-REFERENCE-SERIES STATEMENT--TITLE/UNIFORM TITLE [LOCAL, CANADA]
Uniform title Characterization of low frequency noise in silicon nanowire mosfet and related implications
Holdings
Withdrawn status Lost status Damaged status Not for loan Home library Current library Date acquired Total Checkouts Full call number Barcode Copy number Koha item type
        Mahatma Gandhi Central Library Mahatma Gandhi Central Library 22/10/2021   621.38072 SHA G29559 1 Thesis

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