Characterization of low frequency noise in silicon nanowire mosfet and related implications

By: Shama, Deepak KumarMaterial type: TextTextPublication details: India Indian Institute of Technology 2020Description: 101pSubject(s): Datta, Arnab | Department of Electronics and Communication EngineeringDDC classification: 621.38072
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Item type Current library Call number Copy number Status Date due Barcode
Thesis Thesis Mahatma Gandhi Central Library
621.38072 SHA (Browse shelf(Opens below)) 1 Available G29559

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