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ULSI semiconductor technology atlas by Tung, Chih-hang | Sheng, George T.T. jt.au. Material type: Text Publication details: Hoboken John Wiley and Sons 2003Availability: Items available for loan: 1 Call number: 621.395 T86U.
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Electron microscopy and analysis by Goodhew, Peter J | Humphreys, John jt.au. Material type: Text Publication details: London Taylor and Francis 2001Availability: Items available for loan: 14 Call number: 502.825 G52E, ... Not available: Checked out (1).
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Polymer microscopy by Sawyer, Linda C | Grubb, David T. jt.au. Material type: Text Publication details: New York Springer 2008Availability: Items available for loan: 1 Call number: 620.19204295 S16P.
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Microstructural characterization of materials by Brandon, David | Kaplan, W.D. jt.au. Material type: Text Publication details: England John Wiley and Sons 2008Availability: Items available for loan: 2 Call number: 620.11299 B79M, ...
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Nanocharacterisation by Kirkland, Augus I Ed. Material type: Text Publication details: Cambridge Royal Society of Chemistry 2007Availability: Items available for loan: 1 Call number: 620.5 K73N.
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Electrification phenomena in rocks by Parkhomenko, E.I. Material type: Text Publication details: 1971Availability: Items available for loan: 4 Call number: 552.06 P17E, ...
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Electron microprobe analysis by Reed, S.J.B. Material type: Text Publication details: Cambridge Cambridge University Press 1975Availability: Items available for loan: 3 Call number: 535.3325 R29E, ...
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Ore microscopy and ore petrography by Craig, J.R., Au. Edition: 2ndMaterial type: Text Publication details: New York John Wiley 1994Availability: Items available for loan: 8 Call number: 552 C69O, ...
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